IC TEST ENGINEERING

RaceEL is one of the leading providers of test services for semiconductor ICs across major segments (Communication, Computing, Consumer & Automotive/Industrial) end markets.

Service Overview

Our experienced team will work hand in hand with you for rapid test bring up thereby reducing time to market and cost. We offer full test software / hardware development services for ATE and / or instrument based test routines & programs across all major IC types, covering characterization ,NPI, probe & final test, across product life cycle and continuous improvement efforts, all types of test hardware including high speed / high density load boards, test hardware, necessary personalization kits for probers and handlers.
Our engineering team can also support characterization, 1st articles, 1st release probe/test solutions, leading to prototype/low volume production, then total alignment to transfer to HVM at the foundry, IDM or OSAT test floor(s).

Value Proposition

  • Providing back-end IC test development to customers
  • Design & DFT backgrounds
  • Test Hardware experience
  • Work with designers at the pre silicon phase to enhance the test ability of silicon, greatly increasing the test coverage and effectiveness
  • Swift feasibility studies and test process timeline estimations projections
  • Deep and diverse product exposure and nimble adaption to any new test platform
  • TTR (Test time reduction) audits
  • Extended arm to customer's in house testing team, leveraging the time gap and expediting test development time either through remote or
  • Using in house testers
  • Process mechanisms to ensure utmost quality
  • Consistent upgrading of skills anticipating future needs of clients
  • Secure data network key for off-site development
  • Long term relationships with ATE tester suppliers, test hardware vendors, OSATs foundries and IDMS

Full-turnkey manufacturing solutions including:

  • Pre silicon planning
  • Test hardware & program development
  • Wafer sort
  • Packaged device to test
  • Device characterization
  • Device qualification
  • Production release
  • Post production support

Cross tester platform conversion

  • Not only migration, but also enhance
  • Legacy to latest platform
  • Reduced test time
  • Increased parallelism

Bench Validation:

  • Bench testing for high speed digital, analog, mixed signal & RF
  • Bench testing and characterization in wafer & packaged IC
  • Lab view programming for measurements and automation
  • Production screening using integrated bench instruments with automation
Service brochure
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